MicDAT Conference International Programme Committee and Reviewers Application Form

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Analog, digital, mixed, and RF circuits and related design methodologies

Semiconductor Devices: physics and technology

Logic, architectural, and system level synthesis

Microprocessors, microcontrollers and DSPs

Testing, design for testability, built-in self-test

Area, power, and thermal analysis and design

Non-von Neumann computing and related technologies and circuits

Design and test of high complexity systems integration

SoC, MPSoC, NoC, SIP, and NIP design and test

Process technologies, CMOS, BJT, BiCMOS, GaAs

Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.

Design for Manufacturability/Technology Optimization/Yield & Quality

Microelectronics processing and materials

Nanoprocessing, nanotechnology and nanofabrication​

Computer-Aided Design (CAD) of Integrated Circuits

Algorithms, methods and tools for modeling, simulation, synthesis and verification of ICs

Electronic materials science and technology

Microelectronics reliability and qualification